The development of measurement protocol for characterisation of ultra smooth surfaces

Leigh Brown; Liam Blunt

The development of measurement protocol for characterisation of ultra smooth surfaces

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of the 6th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2006
Editors	H. Zervos
Publisher	euspen
Pages	516-519
Number of pages	4
Volume	1
ISBN (Electronic)	0955308208, 9780955308208
Publication status	Published - 2006
Event	6th International Conference European Society for Precision Engineering and Nanotechnology - Baden bei Wien, Vienna, Austria Duration: 28 May 2006 → 1 Jun 2006 Conference number: 6

Conference

Conference	6th International Conference European Society for Precision Engineering and Nanotechnology
Abbreviated title	EUSPEN 2006
Country/Territory	Austria
City	Vienna
Period	28/05/06 → 1/06/06

Cite this

@inproceedings{6b1c2bc7c21b4c0a8ecb44a3b555f4da,

title = "The development of measurement protocol for characterisation of ultra smooth surfaces",

author = "Leigh Brown and Liam Blunt",

year = "2006",

language = "English",

volume = "1",

pages = "516--519",

editor = "H. Zervos",

booktitle = "Proceedings of the 6th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2006",

publisher = "euspen",

address = "United Kingdom",

note = "6th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2006 ; Conference date: 28-05-2006 Through 01-06-2006",

}

Brown, L & Blunt, L 2006, The development of measurement protocol for characterisation of ultra smooth surfaces. in H Zervos (ed.), Proceedings of the 6th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2006. vol. 1, euspen, pp. 516-519, 6th International Conference European Society for Precision Engineering and Nanotechnology, Vienna, Austria, 28/05/06.

The development of measurement protocol for characterisation of ultra smooth surfaces. / Brown, Leigh ; Blunt, Liam.

Proceedings of the 6th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2006. ed. / H. Zervos. Vol. 1 euspen, 2006. p. 516-519.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The development of measurement protocol for characterisation of ultra smooth surfaces

AU - Brown, Leigh

AU - Blunt, Liam

N1 - Conference code: 6

PY - 2006

Y1 - 2006

UR - http://www.scopus.com/inward/record.url?scp=84908271805&partnerID=8YFLogxK

UR - https://www.tib.eu/en/search/id/TIBKAT%3A514166193/Proceedings-of-the-6th-international-conference/

M3 - Conference contribution

AN - SCOPUS:84908271805

VL - 1

SP - 516

EP - 519

BT - Proceedings of the 6th International Conference European Society for Precision Engineering and Nanotechnology, EUSPEN 2006

A2 - Zervos, H.

PB - euspen

T2 - 6th International Conference European Society for Precision Engineering and Nanotechnology

Y2 - 28 May 2006 through 1 June 2006

ER -

The development of measurement protocol for characterisation of ultra smooth surfaces

Conference

Other files and links

Cite this