Engineering & Materials Science
Specimen preparation
100%
Ion beams
93%
Vacancies
89%
Ion bombardment
70%
Silicon
52%
Defects
45%
Transmission electron microscopy
45%
Ion implantation
29%
Liquid nitrogen
27%
Temperature
26%
Helium
24%
Metal foil
23%
Ions
20%
Semiconductor materials
19%
Chemistry
Ion Bombardment
86%
Ion Beam
72%
Transmission Electron Microscopy
43%
Interstitial
34%
Foil
33%
Semiconductor
25%
Cleavage
22%
Nitrogen
20%
Ambient Reaction Temperature
18%
Liquid
17%
Ion
13%
Surface
10%
Physics & Astronomy
ion beams
51%
preparation
48%
cavities
40%
defects
36%
silicon
35%
bombardment
24%
transmission electron microscopy
17%
helium ions
15%
cleavage
13%
liquid nitrogen
13%
ions
12%
implantation
11%
foils
11%
interstitials
11%
room temperature
7%
interactions
5%
temperature
3%