Abstract
This paper presents a 3D small-field imaging system by using the color fringe projection technique to measure the small objects having large slopes and/or discontinuous surface. A stereo microscope is used to generate a small-field projecting field and to capture the deformed fringe patterns on the measured small objects, respectively. Three fringe sets having the optimum fringe numbers are coded into one major color channel to generate color fringe patterns having the maximum fringe contrast of the captured fringe images. Through one channel of the stereo microscope, a DLP (Digital Light Processing) projector projects these generated color fringe pattern images onto the measured objects surface. From another channel, the fringe patterns are deformed with regard to the object surface and captured by a color CCD camera. The absolute phase of each pixel can be calculated from the captured fringe patterns by using the optimum three-fringe numbers selection method. Experimental results on measuring 3D shape of small objects show the accuracy and availability of the developed 3D imaging system.
Original language | English |
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Title of host publication | International Symposium on Optoelectronic Technology and Application 2014 |
Subtitle of host publication | Laser and Optical Measurement Technology; and Fiber Optic Sensors |
Editors | Jurgen Czarske, Shulian Zhang, David Sampson, Wei Wang, Yanbiao Liao |
Publisher | SPIE |
Number of pages | 8 |
Volume | 9297 |
ISBN (Print) | 9781628413830 |
DOIs | |
Publication status | Published - 3 Dec 2014 |
Event | International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China Duration: 13 May 2014 → 15 May 2014 http://wikicfp.com/cfp/servlet/event.showcfp?eventid=35417©ownerid=60150 (Link to Conference Details) |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Publisher | SPIE |
Volume | 9297 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | International Symposium on Optoelectronic Technology and Application 2014 |
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Abbreviated title | IPTA 2014 |
Country/Territory | China |
City | Beijing |
Period | 13/05/14 → 15/05/14 |
Internet address |
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