The structural and compositional analysis of single crystal surfaces using low energy ion scattering

D. G. Armour, J. A. van den Berg, L. K. Verheij

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The use of ion scattering for surface composition and structure analysis has been reviewed. The extreme surface specificity of this technique has been widely used to obtain qualitative information in a straightforward way, but the occurrence of charge exchange processes, thermal lattice vibrations and multiple scattering have precluded quantitative analysis of experimental data. Examples are quoted to illustrate the progress that has been made in understanding these fundamental processes and in applying this knowledge to the development of the analytical capabilities of the technique.

Original languageEnglish
Pages (from-to)359-378
Number of pages20
JournalJournal of Radioanalytical Chemistry
Issue number1-2
Publication statusPublished - Mar 1979
Externally publishedYes


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