The use of areal surface topography analysis for the inspection of micro-fabricated thin foil laser targets for ion acceleration

Nicola Senin, Liam Blunt, Martin Tolley

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

This paper proposes a novel approach to the characterization of critical dimensions and geometric form error at micro and sub-micrometric scales, suitable for application to micro-fabricated parts and devices. Thin foil laser targets for ion acceleration experiments are selected as the test subject in this instance. The approach is based on acquiring areal maps with a high-precision 3D optical interferometric profilometer and on processing the surface topography data with novel techniques obtained by merging knowledge and algorithms from surface metrology, dimensional metrology and computer vision/image processing for quality inspection. This new approach allows quantitative measurement results for the thin foil laser target to be obtained, and shows promise for being applied to a wide array of similar problems involving quality inspection of micro-parts and devices, and to structured surfaces in general.

LanguageEnglish
Article number105004
JournalMeasurement Science and Technology
Volume23
Issue number10
Early online date14 Aug 2012
DOIs
Publication statusPublished - Oct 2012

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laser targets
Surface Topography
Surface topography
Metrology
Metal foil
Inspection
inspection
foils
topography
Laser
metrology
Target
Lasers
Ions
Critical Dimension
Merging
Computer Vision
Image Processing
profilometers
ions

Cite this

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The use of areal surface topography analysis for the inspection of micro-fabricated thin foil laser targets for ion acceleration. / Senin, Nicola; Blunt, Liam; Tolley, Martin.

In: Measurement Science and Technology, Vol. 23, No. 10, 105004, 10.2012.

Research output: Contribution to journalArticle

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