Fingerprint
Dive into the research topics of 'Theoretical calculations of the broadening of dilute Si, Al and Be doped δ layers in GaAs during SIMS depth profiling'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Theoretical calculations of the broadening of dilute Si, Al and Be doped δ layers in GaAs during SIMS depth profiling
R. Badheka, JA Van den Berg, DG Armour, M. Wadsworth
Research output: Contribution to journal › Article › peer-review
4
Citations
(Scopus)