Towards a Maturity Model for Networks of Practice: A Case of K2 Tree Optimization

Quan Shi, Yanghua Xiao, Nik Bessis, Yiqi Lu, Yaoliang Chen, Richard Hill

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Of late there has been considerable interest in the efficient and effective storage of large-scale network graphs, such as those within the domains of social networks, web and virtual communities. The representation of these data graphs is a complex and challenging task and arises as a result of the inherent structural and dynamic properties of a community network, whereby naturally occurring churn can severely affect the ability to optimize the network structure. Since the organization of the network will change over time, we consider how an established method for storing large data graphs (K2 tree) can be augmented and then utilized as an indicator of the relative maturity of a community network. Within this context, we present an algorithm illustrating that the compression effectiveness reduces as the community network structure becomes more dynamic.

Original languageEnglish
Title of host publication2011 International Conference on Emerging Intelligent Data and Web Technologies (EIDWT)
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-5
Number of pages5
ISBN (Print)9781457708404
DOIs
Publication statusPublished - 15 Nov 2011
Externally publishedYes
Event2nd International Conference on Emerging Intelligent Data and Web Technologies - Tirana, Albania
Duration: 7 Sep 20119 Sep 2011
Conference number: 2

Conference

Conference2nd International Conference on Emerging Intelligent Data and Web Technologies
Abbreviated titleEIDWT 2011
CountryAlbania
CityTirana
Period7/09/119/09/11

Cite this

Shi, Q., Xiao, Y., Bessis, N., Lu, Y., Chen, Y., & Hill, R. (2011). Towards a Maturity Model for Networks of Practice: A Case of K2 Tree Optimization. In 2011 International Conference on Emerging Intelligent Data and Web Technologies (EIDWT) (pp. 1-5). [6076413] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EIDWT.2011.11