Towards a Novel Phase Unwrapping Model for Three Dimensional Measurement

Hailong Tan, Yuanping Xu, Yanlong Cao, Benjun Guo, Tukun Li, Jian Huang, Jun Lu, Han Jiang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In order to obtain a higher quantity absolute phase, a novel phase unwrapping model by combination of dual-frequency heterodyne and segmented quantifization phase coding method is proposed in this research. This model also provides a generalized phase order error correction method for eliminate phase order jump errors. Only ten fringe patterns are used for the projection in this study. The workflow of the devised model starts with acquisition of the low frequency wrapped phase by using the classic double-frequency heterodyne method, and then it moves to obtain the fringe order of low frequency wrapped phase based on the projected segmented quantifization phase coding patterns. In this step, two-dimensional scanning lookup method is used to eliminate the noise points caused by the rounding operation. Then, new fringe order can be obtained by combination of the obtained fringe order of low frequency wrapped phase and the new projected binary fringe pattern with complementarity, and this new fringe order combined with the previous fringe order can be used to unwrap the heterodyne phase. Finally, the wrapped phase of the dual-frequency is unwrapped through unwrapped heterodyne phase and the highest frequency phase. This study applies metal workpiece measurements as case studies to test the validity of the proposed model. The experimental results show that the error effects of fringe order can be eliminated, and the high frequency fringes retain more information on the measure workpiece surfaces.

Original languageEnglish
Title of host publication2021 International Conference of Optical Imaging and Measurement, ICOIM 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages157-161
Number of pages5
ISBN (Electronic)9780738112121, 9781665403542, 9781665403535
ISBN (Print)9781665447799
DOIs
Publication statusPublished - 2 Sep 2021
Event2021 International Conference of Optical Imaging and Measurement - Xi'an, China
Duration: 27 Aug 202129 Aug 2021

Conference

Conference2021 International Conference of Optical Imaging and Measurement
Abbreviated titleICOIM 2021
CountryChina
CityXi'an
Period27/08/2129/08/21

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