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Towards the development of a hybrid-integrated chip interferometer for online surface profile measurements
P. Kumar
,
H. Martin
,
X. Jiang
Department of Engineering and Technology
School of Computing and Engineering
Centre for Precision Technologies
Research output
:
Contribution to journal
›
Article
›
peer-review
4
Citations (Scopus)
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Physics & Astronomy
interferometers
65%
chips
64%
profiles
43%
probes
27%
metrology
22%
scanning
21%
interferometry
19%
sensors
14%
integrated optics
13%
miniaturization
13%
pressing
12%
lasers
10%
manufacturing
9%
wafers
8%
engineering
8%
microscopy
8%
photonics
7%
characterization
6%
silicon
6%
diffraction
6%
performance
5%
Engineering & Materials Science
Interferometers
100%
Interferometry
24%
Scanning
23%
Integrated optics
15%
Lasers
15%
Silicon wafers
12%
Photonics
11%
Microscopic examination
10%
Diffraction
10%
Nondestructive examination
10%
Sensors
10%
Characterization (materials science)
8%