Ultra-Fast High-Resolution Solar Cell Cracks Detection Process

Research output: Contribution to journalArticle

Abstract

This paper presents the advancement of an ultra-fast high-resolution cracks detection in solar cells manufacturing system. The aim of the developed process is to (i) improve the quality of the calibrated image taken by a low-cost conventional electroluminescent (EL) imaging setup, (ii) proposing a novel methodology to enhance the speed of the detection of the solar cell cracks, and finally (iii) develop a proper procedure to decide whether to accept or reject the solar cell due to the existence of the cracks. The proposed detection process has been validated on various cracked/free-crack solar cell samples, evidently it was found that the cracks type, size and orientation are more visible using the proposes method, while the speed of calibrating the EL images are in the range of 0.1s to 0.3s, excluding the EL imaging time.
LanguageEnglish
JournalIEEE Transactions on Industrial Informatics
Early online date8 Oct 2019
DOIs
Publication statusE-pub ahead of print - 8 Oct 2019

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Crack detection
Solar cells
Cracks
Imaging techniques
Costs

Cite this

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title = "Ultra-Fast High-Resolution Solar Cell Cracks Detection Process",
abstract = "This paper presents the advancement of an ultra-fast high-resolution cracks detection in solar cells manufacturing system. The aim of the developed process is to (i) improve the quality of the calibrated image taken by a low-cost conventional electroluminescent (EL) imaging setup, (ii) proposing a novel methodology to enhance the speed of the detection of the solar cell cracks, and finally (iii) develop a proper procedure to decide whether to accept or reject the solar cell due to the existence of the cracks. The proposed detection process has been validated on various cracked/free-crack solar cell samples, evidently it was found that the cracks type, size and orientation are more visible using the proposes method, while the speed of calibrating the EL images are in the range of 0.1s to 0.3s, excluding the EL imaging time.",
keywords = "Solar Cells, Micro Cracks Detection, Electroluminescence, Photovoltaics",
author = "Mahmoud Dhimish and Peter Mather",
year = "2019",
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doi = "10.1109/TII.2019.2946210",
language = "English",
journal = "IEEE Transactions on Industrial Informatics",
issn = "1551-3203",
publisher = "IEEE Computer Society",

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AB - This paper presents the advancement of an ultra-fast high-resolution cracks detection in solar cells manufacturing system. The aim of the developed process is to (i) improve the quality of the calibrated image taken by a low-cost conventional electroluminescent (EL) imaging setup, (ii) proposing a novel methodology to enhance the speed of the detection of the solar cell cracks, and finally (iii) develop a proper procedure to decide whether to accept or reject the solar cell due to the existence of the cracks. The proposed detection process has been validated on various cracked/free-crack solar cell samples, evidently it was found that the cracks type, size and orientation are more visible using the proposes method, while the speed of calibrating the EL images are in the range of 0.1s to 0.3s, excluding the EL imaging time.

KW - Solar Cells

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JF - IEEE Transactions on Industrial Informatics

SN - 1551-3203

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