Abstract
An embedded mixed-signal test system that utilises a sigma-delta modulator as a vehicle to test analogue and digital embedded circuits is presented. A self-characterisation routine and simulation results relating to a behavioural sigma-delta model of the system will show how correlation analysis techniques can be used to evaluate the impulse response of a linear module under test (MUT) and how frequency and amplitude signal faults can be detected and accurately measured.
Original language | English |
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Pages (from-to) | 689-699 |
Number of pages | 11 |
Journal | Microelectronics Journal |
Volume | 31 |
Issue number | 8 |
Early online date | 16 Aug 2000 |
DOIs | |
Publication status | Published - 16 Aug 2000 |