Abstract
An embedded mixed-signal test system that utilises a sigma-delta modulator as a vehicle to test analogue and digital embedded circuits is presented. A self-characterisation routine and simulation results relating to a behavioural sigma-delta model of the system will show how correlation analysis techniques can be used to evaluate the impulse response of a linear module under test (MUT) and how frequency and amplitude signal faults can be detected and accurately measured.
| Original language | English |
|---|---|
| Pages (from-to) | 689-699 |
| Number of pages | 11 |
| Journal | Microelectronics Journal |
| Volume | 31 |
| Issue number | 8 |
| Early online date | 16 Aug 2000 |
| DOIs | |
| Publication status | Published - 16 Aug 2000 |
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