TY - JOUR
T1 - Virtual fringe projection system with nonparallel illumination based on iteration
AU - Zhou, Duo
AU - Wang, Zhangying
AU - Gao, Nan
AU - Zhang, Zonghua
AU - Jiang, Xiangqian
PY - 2017/4/11
Y1 - 2017/4/11
N2 - Fringe projection profilometry has been widely applied in many fields. To set up an ideal measuring system, a virtual fringe projection technique has been studied to assist in the design of hardware configurations. However, existing virtual fringe projection systems use parallel illumination and have a fixed optical framework. This paper presents a virtual fringe projection system with nonparallel illumination. Using an iterative method to calculate intersection points between rays and reference planes or object surfaces, the proposed system can simulate projected fringe patterns and captured images. A new explicit calibration method has been presented to validate the precision of the system. Simulated results indicate that the proposed iterative method outperforms previous systems. Our virtual system can be applied to error analysis, algorithm optimization, and help operators to find ideal system parameter settings for actual measurements.
AB - Fringe projection profilometry has been widely applied in many fields. To set up an ideal measuring system, a virtual fringe projection technique has been studied to assist in the design of hardware configurations. However, existing virtual fringe projection systems use parallel illumination and have a fixed optical framework. This paper presents a virtual fringe projection system with nonparallel illumination. Using an iterative method to calculate intersection points between rays and reference planes or object surfaces, the proposed system can simulate projected fringe patterns and captured images. A new explicit calibration method has been presented to validate the precision of the system. Simulated results indicate that the proposed iterative method outperforms previous systems. Our virtual system can be applied to error analysis, algorithm optimization, and help operators to find ideal system parameter settings for actual measurements.
KW - Explicit calibration
KW - Fringe projection system
KW - Nonparallel illumination
KW - Simulation
UR - http://www.scopus.com/inward/record.url?scp=85019984925&partnerID=8YFLogxK
U2 - 10.1088/1361-6501/aa6597
DO - 10.1088/1361-6501/aa6597
M3 - Article
AN - SCOPUS:85019984925
VL - 28
SP - 1
EP - 9
JO - Measurement Science and Technology
JF - Measurement Science and Technology
SN - 0957-0233
IS - 6
M1 - 065201
ER -