Wavelength scanning interferometer for structured surfaces

Research output: Chapter in Book/Report/Conference proceedingConference contribution

LanguageEnglish
Title of host publicationProceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010
Pages11-15
Number of pages5
Volume49
Publication statusPublished - 1 Dec 2010
EventAmerican Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology - The Crowne Plaza, Asheville, United States
Duration: 23 Jun 201025 Jun 2010
http://www.aspe.net/meetings/2010_Summer/ASPE_Summer_Program.pdf (Link to Event Programme)

Conference

ConferenceAmerican Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology
Abbreviated titleASPE 2010
CountryUnited States
CityAsheville
Period23/06/1025/06/10
Internet address

Cite this

Jiang, X., & Gao, F. (2010). Wavelength scanning interferometer for structured surfaces. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010 (Vol. 49, pp. 11-15)
Jiang, X. ; Gao, F. / Wavelength scanning interferometer for structured surfaces. Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49 2010. pp. 11-15
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title = "Wavelength scanning interferometer for structured surfaces",
author = "X. Jiang and F. Gao",
year = "2010",
month = "12",
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language = "English",
isbn = "9781887706544",
volume = "49",
pages = "11--15",
booktitle = "Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010",

}

Jiang, X & Gao, F 2010, Wavelength scanning interferometer for structured surfaces. in Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. vol. 49, pp. 11-15, American Society for Precision Engineering Topical Meeting on Precision Interferometric Metrology, Asheville, United States, 23/06/10.

Wavelength scanning interferometer for structured surfaces. / Jiang, X.; Gao, F.

Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49 2010. p. 11-15.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Wavelength scanning interferometer for structured surfaces

AU - Jiang, X.

AU - Gao, F.

PY - 2010/12/1

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M3 - Conference contribution

SN - 9781887706544

VL - 49

SP - 11

EP - 15

BT - Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010

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Jiang X, Gao F. Wavelength scanning interferometer for structured surfaces. In Proceedings - ASPE Summer Topical Meeting on Precision Interferometric Metrology, ASPE 2010. Vol. 49. 2010. p. 11-15