Wavelets and their Applications for Surface Metrology

X. Jiang, P. Scott, D. Whitehouse

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

This paper presents three generations of wavelet representations that are designed for micro/nano-scale surfaces. These wavelets include a basic biorthogonal wavelet (for the establishment of a surface filtering equation), an evolutionary lifting wavelet (for surface oriented frequency analysis, surface recognition and reconstruction with nano-scale accuracy) and a complex wavelet (for surface morphological feature extraction). The benefits of using these wavelets in the subject area will be demonstrated throughout as follows (1) their metrology properties: the linear phase, finite impulse filtering, simplicity and naturalness, shift-invariance and direction sensitivity; (2) practical applications in surface measurement denoising, feature extraction for engineering and bioengineering surfaces.

Original languageEnglish
Pages (from-to)555-558
Number of pages4
JournalCIRP Annals - Manufacturing Technology
Volume57
Issue number1
DOIs
Publication statusPublished - 9 May 2008

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Feature extraction
Surface measurement
Surface analysis
Invariance
Bioengineering

Cite this

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Wavelets and their Applications for Surface Metrology. / Jiang, X.; Scott, P.; Whitehouse, D.

In: CIRP Annals - Manufacturing Technology, Vol. 57, No. 1, 09.05.2008, p. 555-558.

Research output: Contribution to journalArticle

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AU - Scott, P.

AU - Whitehouse, D.

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