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Wavelets and their Applications for Surface Metrology
X. Jiang
,
P. Scott
, D. Whitehouse
School of Computing and Engineering
Centre for Precision Technologies
Research output
:
Contribution to journal
›
Article
›
peer-review
73
Citations (Scopus)
Overview
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Engineering & Materials Science
Feature extraction
100%
Bioengineering
89%
Surface analysis
83%
Surface measurement
81%
Invariance
68%