Weak-beam dark-field electron tomography of dislocations in GaN

J. S. Barnard, J. Sharp, J. R. Tong, P. A. Midgley

Research output: Contribution to journal › Conference article › peer-review

16 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Weak-beam dark-field electron tomography of dislocations in GaN'. Together they form a unique fingerprint.

Physics & Astronomy