X-ray lasers as probes of plasma parameters

G. J. Tallents, N. Booth, M. H. Edwards, L. M.R. Gartside, H. Huang, A. K. Rossall, E. Wagenaars, D. S. Whittaker, Z. Zhai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)


General issues relevant to the probing of plasmas with backlighters are first discussed. It is shown that soft x-ray wavelengths (> 10 nm) can generally probe thicker plasmas than harder radiation (< 1 nm) if the plasma is hot (> 100 eV). Demonstration experiments are discussed where the transmission of x-ray lasers through other laser-heated solid targets have been used (i) to measure the rate of laser ablation of solid targets and (ii) to probe the opacity of a plasma material. It is shown that narrow bandwidth radiation, such as from an x-ray laser, offers the ability to probe much more optically thick plasmas than backlighters composed of moderate to wide bandwidth spectral lines.

Original languageEnglish
Title of host publicationX-Ray Lasers 2008 - Proceedings of the 11th International Conference
EditorsCiaran L.S. Lewis, Dave Riley
PublisherSpringer Science and Business Media, LLC
Number of pages10
ISBN (Print)9781402099236
Publication statusPublished - 29 Jul 2009
Externally publishedYes
Event11th International Conference on X-Ray Lasers - Belfast, United Kingdom
Duration: 17 Aug 200822 Aug 2008
Conference number: 11


Conference11th International Conference on X-Ray Lasers
Country/TerritoryUnited Kingdom
Internet address


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