Manufacturing is progressing towards realising the fourth industrial revolution. This revolution is described as the increased use of smart technology to automate traditional manufacturing and industrial practices allowing for a more sustainable, connected manufacturing environment where data is provided at every stage in real time. This is achieved through the use of in-situ, on-machine measurements. To obtain this data metrology is required, and metrology requires sensing. Current optical instrumentation is rather large and bulky due to the inherent size of conventional optical components. Optical metasurfaces offer a step-change to significantly reduce the size and weight of optical instrumentation. This thesis presents multiple metasurface based optical instrumentation for metrological applications providing significant reductions in size and weight compared to traditional optical instrumentation. Firstly, an interleaved metasurface that can perform all the necessary optical manipulations to operate as a confocal sensor in a volume of only 5 mm2 is presented, which includes the first demonstration of a surface measurement taken with such a metasurface. Building upon this a design for an interleaved metasurface that performs all the necessary optical manipulations to perform as a tip-tilt displacement sensor is presented. Following this a multi-element metasurface designed with a tunable focal length is presented, displaying the versatility metasurface based sensors can offer. Additionally, the alignment challenges encountered with multi-element metasurfaces are discussed as well as an alignment solution that will provide invaluable when designing metasurface instrumentation. A novel, fast, efficient simulation method is also presented and discussed which would allow a significant reduction in simulation time compared to traditional simulation methods. Lastly, ruggedisation considerations are discussed and simulated to allow metasurface sensors to be deployed in real-life environments. Both a design reducing the alignment complexity of the sensor and one that provides a protective layer over the metasurface are considered. Finally, an insight into the research required to bring the proliferation of metasurface sensors into the manufacturing environment is discussed including a discussion into scaling up metasurface fabrication to the level needed to mass-produce metasurfaces for sensor applications.